{"id":1348,"date":"2010-08-05T10:11:33","date_gmt":"2010-08-05T15:11:33","guid":{"rendered":"http:\/\/heatsinks.wordpress.com\/?p=1348"},"modified":"2016-02-19T14:50:29","modified_gmt":"2016-02-19T18:50:29","slug":"thermal-management-for-testing-high-power-ic-devices","status":"publish","type":"post","link":"https:\/\/www.qats.com\/cms\/2010\/08\/05\/thermal-management-for-testing-high-power-ic-devices\/","title":{"rendered":"Thermal Management for Testing High-Power IC Devices"},"content":{"rendered":"<p>AT ATS we come across a wide variety of thermal issues in electronics. One of the more unique problems involved inventing a cooling test head for semiconductor test equipment.The original test head was unable to accurately perform a test since the semiconductors it was testing were so hot!<\/p>\n<p>It appears ATS isn&#8217;t the only one running into such\u00a0 unique problems!<\/p>\n<p>Jihad Hammoud, Ph.D., at <a href=\"http:\/\/www.kns.com\/\">Kulicke &amp; Soffa<\/a>, has written a good article for Evaluation Engineering Magazine entitled, &#8220;<a href=\"http:\/\/www.evaluationengineering.com\/index.php\/solutions\/environmental-test\/thermal-management-for-testing-high-power-ic-devices.html\">Thermal Management for Testing High-Power IC Devices<\/a>&#8220;. In his article he notes the following:<\/p>\n<ul>\n<li>As the transistor density and switching speed of integrated circuits (ICs) increase and the package size decreases, the emerging generation of high-power ICs requires thermal management during testing to ensure accurate results.<\/li>\n<li>The choice of a thermal management system depends largely on the specific test application. High power simulation, temperature characterization, and high-volume production testing are three applications that require thermal management for high power devices. However, each application has different degrees of accuracy, speed, and overall cost.<\/li>\n<li>The variations in accuracy, range, speed, and cost of different thermal management methods mean that no single one will meet the objectives of every high-power test application. Rather, the method selected will be the one that best meets the critical requirements of a specific test application.<\/li>\n<\/ul>\n<p>He has a terrific chart at the end that does a nice job of summarizing various thermal management options. The article is well worth a read on the topic of thermal management in test.\u00a0 You can find it at Evaluation Engineering Magazine, &#8220;<a href=\"http:\/\/www.evaluationengineering.com\/index.php\/solutions\/environmental-test\/thermal-management-for-testing-high-power-ic-devices.html\">Thermal Management for Testing High-Power IC Devices<\/a>&#8220;.<\/p>\n","protected":false},"excerpt":{"rendered":"<p>AT ATS we come across a wide variety of thermal issues in electronics. One of the more unique problems involved inventing a cooling test head for semiconductor test equipment.The original test head was unable to accurately perform a test since &hellip; <a href=\"https:\/\/www.qats.com\/cms\/2010\/08\/05\/thermal-management-for-testing-high-power-ic-devices\/\">Continue reading <span class=\"meta-nav\">&rarr;<\/span><\/a><\/p>\n","protected":false},"author":1,"featured_media":0,"comment_status":"open","ping_status":"open","sticky":false,"template":"","format":"standard","meta":{"footnotes":""},"categories":[30,63],"tags":[],"class_list":["post-1348","post","type-post","status-publish","format-standard","hentry","category-heat-sinks","category-thermal-management"],"_links":{"self":[{"href":"https:\/\/www.qats.com\/cms\/wp-json\/wp\/v2\/posts\/1348","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/www.qats.com\/cms\/wp-json\/wp\/v2\/posts"}],"about":[{"href":"https:\/\/www.qats.com\/cms\/wp-json\/wp\/v2\/types\/post"}],"author":[{"embeddable":true,"href":"https:\/\/www.qats.com\/cms\/wp-json\/wp\/v2\/users\/1"}],"replies":[{"embeddable":true,"href":"https:\/\/www.qats.com\/cms\/wp-json\/wp\/v2\/comments?post=1348"}],"version-history":[{"count":0,"href":"https:\/\/www.qats.com\/cms\/wp-json\/wp\/v2\/posts\/1348\/revisions"}],"wp:attachment":[{"href":"https:\/\/www.qats.com\/cms\/wp-json\/wp\/v2\/media?parent=1348"}],"wp:term":[{"taxonomy":"category","embeddable":true,"href":"https:\/\/www.qats.com\/cms\/wp-json\/wp\/v2\/categories?post=1348"},{"taxonomy":"post_tag","embeddable":true,"href":"https:\/\/www.qats.com\/cms\/wp-json\/wp\/v2\/tags?post=1348"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}