Tag Archives: thermal characterization

ATS Wind Tunnels Designed for SSD and PCIe Thermal Characterization

As was outlined in an earlier article on this blog, it is critical for manufacturers to characterize solid-state drives (SSD) to establish performance parameters in real-world conditions. The previous article explained that SSD experience higher failure rates and reduced lifespan when temperatures increase beyond the standard operating range of 30-40°C.

Wind Tunnels
ATS designed wind tunnels for companies looking to characterize solid-state drives in the PCIe form factor, as show above. (Wikimedia Commons)

Testing processes for SSD are similar to those used for characterizing typical semiconductors. A wind tunnel provides a consistent, controlled, and repeatable environment for data collection and sensors, thermocouples, and an analog-to-digital capture system allows engineers to measure performance when the SSD is impacted by external factors.

ATS designs and fabricates research-quality wind tunnels that can be used for characterizing SSD. The wind tunnels give engineers control over air temperature and velocity. Closed-loop wind tunnels can create environments with temperatures as high as 80°C to provide stressed conditions well above standard operating temperatures. The manufacturer can use this data to set reference points for different environments, such as in 1-U telecommunications chassis or large server boxes.

Recently, ATS has worked with two of the industry’s largest producers of SSD to design wind tunnels that could be used for characterizing drives in PCIe applications. PCIe (peripheral component interconnect express) cards are high-speed serial computer extension cards that connect peripheral devices to the motherboard. In addition to SSD, these cards can be used for graphics processors, Wi-Fi, or other hard drives.

ATS wind tunnels can be used to test airflow and thermal performance for components and boards, as shown in this smoke flow visualization test over a maxiFLOW™ heat sink. (Advanced Thermal Solutions, Inc.)

One of the wind tunnels was a standard, open loop CWT-107™. It can produce uniform and homogeneous flow, up to 5.5 m/s (1100 ft/min) within the wind tunnel’s test section due to its polynomial shape and internal flow management system, which features honeycombs and screens to break up turbulence. The wind tunnel can be operated either vertically or horizontally and the customer chose to use it lying down.

In fact, the customer was very creative in its use of the wind tunnel. A customized cart was built for the wind tunnel to be bolted to and then the cart was wheeled into a large environmental chamber where temperatures could be raised to test levels. The SSD being characterized was a PCIe card with memory installed. There was no fan for the memory and the memory had no shielding or housing.

The customer placed its PCIe-based SSD flat in the test chamber. Power was pulled through the test ports included in the test chamber of the CLWT-107™ (as shown below).

While the wind tunnel was bought for testing SSD, it could be used by the customer to test any electronic component or board.

The second customer purchased a CLWT-115™ closed-loop wind tunnel. In this case, the application required the SSD to be powered through the PCIe back plane, so ATS custom-designed slots in the test section to fit the PCIe form factor. The slots allowed the SSD to remain inside the test section and be connected to a motherboard residing outside the wind tunnel (see below).

Again, the wind tunnel could be used to test any PCIe cards, not just SSD, if the customer desired, as there were also fillers created for the slots to allow the wind tunnel to be used when testing other devices.

The second customer did all of its air velocity and temperature testing in the CLWT-115™, rather than using an environmental chamber like the first customer, because the wind tunnel has a self-contained heating unit that heats air while it circulates during testing.

Wind tunnel controllers and ATVS systems were also purchased by both customers to ensure accurate data collection. The first customer bought an ATVS-NxT™, which is a fully portable scanner that operates with an embedded PC and touch screen control, while the second customer bought the ATVS-2020™, which allows single- or multi-point measurement of both temperature and velocity, and a CLWTC-1000™, which automatically controlled the airflow and temperature through the test chamber.

Both come with Candlestick sensors to control the air velocity in the wind tunnel and thermocouples to control the temperature.

One of the customers also requested a custom, rugged sensor to avoid damage through multiple uses. ATS was able to adapt one of its handheld surface probes, a stainless-steel probe with a pointed tip for exact positioning of the sensor on the desired spot, by reducing the length and designing a custom port that would hold the sensor in place.

SSD are gaining traction in the market, with major hard drive manufacturers and the companies that utilize them both making the switch to solid-state technology. This means that thermal characterization of SSD and thermal management systems deployed to dissipate the heat of these drives are going to be of increasing importance in the coming years.

Using research-quality wind tunnels gives manufacturers a leg up in determining how their drives will perform in different real-world environments and makes the process of SSD characterization easier for users. By working with ATS, companies can tailor their wind tunnels to their specific applications and can be assured of the accuracy of the data that they collect.

Learn more about ATS wind tunnels, sensors, and the entire line of next-generation thermal test instruments at https://www.qats.com/Products/
Instruments. If you have questions about any products or ATS thermal testing services, email ats-hq@qats.com.


For more information about Advanced Thermal Solutions, Inc. (ATS) thermal management consulting and design services, visit https://www.qats.com/consulting or contact ATS at 781.769.2800 or ats-hq@qats.com.

ATS’ Standard Board Level Heat Sinks for PCB

We’ve just released our new line of standard board level heat sinks. These stamped heat sinks are ideal for PCB application, especially where TO-220 packages are used. Available now through Digi-Key Electronics​ or at this link from ATS http://www.qats.com/eShop.aspx?produc…

 

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Read The Specs but Test The Product: How to Perform Thermal Characterization of Board Mounted Power Supplies

Board mounted power supplies are an important part of  many electronic systems.  There are a number of reasons for that, among them, space savings, lower thermal footprint, and reduction in noise.   With those advantages, specifying the right supply is an important task for the design or component engineer.  And once you do, characterizing the device is important.  The specifications from the manufacturer may be correct in their lab, but, verifying in your lab insures your end product is safe.

Characterizing a device can take many forms based on what the device is, but the overall goal is to insure the device is consistent with the specifications supplied and meets the design point for a given project.  In the case of board mounted power supply, thermally characterization is part of this process.

The team at Ericsson has put together a white paper on the thermal characterization of board mounted power supplies in a sealed box:  one of the more demanding thermal applications.  In the white paper they note:

  • Applications where board mounted power supplies may be most often used in a sealed box
  • A suggested test set up to perform characterization that simulates a sealed box
  • An example test to give engineers an idea of outcomes

The white paper does a good job at explaining these pieces and you can get your copy here: Ericsson Board Mounted Power Supply Thermal Characterization Procedure.

Need a heat sink for your next power brick application?  See ATS’s power brick family of heat sinks is ready for your hottest power supply application

Like what you read here on ATS’s Thermal Engineering Blog?   If you do, subscribe to Qpedia, our industry leading thermal magazine for engineers.

 

 

ATS Expands in the COTS Market with its Wind Tunnel Sale to the US Navy

ATS has continued to expand in the COTS industry because of its expertise in resolving thermal challenges through its consulting services, cooling solutions, and thermal test instruments. Most recently, the CWT-107 open loop wind tunnel was sold to the United States Navy for use in their Research Development Labs.

 

CWT-107

CWT-107 Open Loop Wind Tunnel

The CWT-107 is a research quality wind tunnel designed for multiple PCB and component level testing. It is used in air flow characterization and flow visualization, thermal resistance measurements and generation of P-Q curves. The large test section (24″ x 2″ x 7″) is designed to accommodate multiple PCBs, as seen in a typical ATCA chassis. The wind tunnel can also be used to characterize different heat sink sizes for natural and forced convection cooling. Additionally, multiple heat sinks can be tested side by side to determine their thermal performance in the same environment.

The following video is a brief demonstration and walk through of the CWT-107 Open Loop Wind Tunnel:

To learn more about the CWT-107 and how ATS products can be utilized in COTS applications, please visit www.qats.com.

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ATS Offers Arrow Customers a Half-Day of Free Access to its Thermal Characterization Lab

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As part of the new distribution agreement between Arrow Electronics and Advanced Thermal Solutions, Inc., ATS is offering a half-day of free, no-obligation use of its unique Thermal Characterization Laboratory to Arrow customers. The Thermal Characterization Lab, located at ATS headquarters in Norwood, MA, allows engineers to perform thermal testing on heat sinks, fans and fan trays, PCBs, blades, enclosures, or complete systems. Experienced engineers, board and system designers can perform the tests themselves, or consult with an ATS thermal engineer at no cost during their 4 hours of laboratory time.

ATS’ Thermal Characterization Lab features a full range of research-quality instruments, including open and closed loop wind tunnels, for ambient and elevated temperature testing, all with PC-driven controls and automated data collection. The lab is also outfitted with a full array of the company’s sensor systems and thermocouples, which can be used to characterize electronic products under variable airflow and temperature conditions.

Liquid Crystal Thermography

In addition, the lab also features a JEDEC approved component thermal testing facility for conducting multitude of device level testing per JEDEC standards. The facility also provides a complete liquid crystal and IR thermography systems for non-invasive temperature mapping to 0.1oC with one micron-level spatial resolution; and a liquid cooling facility for complete testing and characterization of cold-plates, cooling effect and proof of concept testing.

 

“Most of today’s electronics have thermal situations that can turn into big problems if left alone. The easiest, lowest cost way to manage this is to conduct an accurate thermal characterization of the problem at hand,” said Kaveh Azar, Ph.D., President and CEO of Advanced Thermal Solutions, Inc. “If you have the right facility and associated know-how, you can often complete your test in a half-day, then you can readily assess what is the best thermal solution for your application. For engineers short on time and resources, we believe this free use of ATS’ Thermal Characterization Lab could be very helpful.”

Download the Brochure

To contact ATS for more information on this opportunity, please call 781-769-2800, email ats-hq@qats.com or visit www.qats.com.